Surface and Thin Film Analysis
Division 6.1
The Surface and Thin Film Analysis division develops and applies advanced methods of imaging-based chemical micro-range and surface analysis in all fields of application of surface technology and material development. The analysis is provided for a range of scales (10 nm - several 10 µm).
In the research area "Metrology in Chemistry", new approaches to the production of traceability chains are being pursued. Quality management of this kind of analysis is being further developed through metrology-related and pre-normative research, the development and maintenance of standards, the organization of round robin tests and workshops and the supply of certified reference materials.
The training of specialists in the field of micro-range and surface analysis is facilitated by supporting doctoral theses (in cooperation with universities) and post-doctoral stays.
Projects:
Graphene: Europe in the Lead Coordination and Support Action
ACCORDs - Green deal inspired correlative imaging-based characterization for safety profiling of 2D materials
PowerElec - Development of novel metrological methods and instrumentation supporting a step-change in productivity of the power electronics industry
PlasticsFatE - Plastics Fate and Effects in the human body
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Fields of expertise
- Morphological characterization of material surfaces: Size, shape, topography, porosity
- Chemical characterization of material surfaces: elemental composition (qualitative and quantitative), oxidation states, chemical bonding states
- Layer analysis: layer thickness, chemical composition, optical properties, including coating technique
- Particle analysis including detailed sample preparation: particle size distribution, shape, surface functionalization, core-shell structures
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Main activities
- Development of reference methods, materials and data for the risk assessment of nano(structured) materials/ advanced materials
- Thin-film analysis of semiconductors, metals, polymers, energy and 2D materials
- Standardization and metrology of 2D materials (graphene-related 2D materials)
- Characterization of energy materials in the micrometer and nanometer range
Comittee work:
ISO: ISO/TC 201 Surface Chemical Analysis, ISO/TC 202 Microbeam Analysis, ISO/TC 229 Nanotechnologies, ISO/TC 107 Metallic and other inorganic coatings
CCQM Working Group on Surface Analysis (CCQM-SAWG)Management of international pre-normative projects:
VAMAS/TWA 2 Surface Chemical Analysis, P A33: Chemical composition of functionalized graphene with X-ray photoelectron spectroscopy (XPS)
VAMAS/TWA 34 Nanoparticle Populations, P 15: Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension
VAMAS/TWA 34 Nanoparticle Populations, P 16: Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension
VAMAS/TWA 41 Graphene and Related 2D Materials, P13: Lateral size of graphene oxide flakes by Scanning Electron Microscopy (SEM)
VAMAS/TWA 45 Micro and Nano Plastics in the Environment, P2: Development of standardized methodologies for characterisation of microplastics with microscopy and spectroscopy methods -
Range of services/technical equipment
• (Hard) X-ray photoelectron spectroscopy (HAXPES, XPS)
• Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
• Ellipsometry
• Analytical scanning electron microscopy (SEM)
• Energy dispersive X-ray spectroscopy (EDS)
• Transmission scanning electron microscopy (T-SEM)
• Auger electron microscopy (SAM)
• X-ray absorption spectroscopy (XAS, NEXAFS)
• Infrared spectroscopy and microscopy
• White light interference microscopy
• Coating technologies: electron beam evaporation and magnetron sputtering, plasma CVD
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Publications of the division
In the database PUBLICA you will find publications by BAM employees.
Publications of the division Surface Analysis and Interfacial Chemistry in PUBLICA
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Dr.-Ing. Vasile-Dan Hodoroaba
